Why choose the ETRA DAQ system for your data acquisition needs?

Data acquisition is only part of a sensor test system. The same setup may need programmable supplies, precise control sequences, readout and processing before results reach a computer. ETRA brings those functions onto one FPGA-based platform.

Carry the test system from bench to wafer

ETRA bench boxes and probe-card electronics share the same hardware platform. Firmware, test recipes and data formats can carry from the bench to wafer testing, rather than being rebuilt around a separate acquisition system.

That continuity matters when a laboratory measurement becomes a repeated test workflow. Define the signals, timing and results you need before choosing the final configuration.

Process data in the FPGA

The newest architecture supports up to 64 channels at up to 2 Gbps per lane, with processing on Zynq UltraScale+. Processing in the FPGA lets the host receive results instead of handling every raw sample itself.

The platform also provides ten programmable rails and eight 24-bit voltage or current channels. GUI, Python plugins, TCP and Linux APIs support different ways of controlling the system.

Match the configuration to the application

ETRA is in paid industrial use with automotive and railway customers. Its engineering work covers image-sensor test benches, probe cards and quantum hardware. Those contexts have different requirements; a useful starting point is your interface list, timing constraints and intended processing.

Where temperature control is part of the setup, TEC X8 provides eight Peltier outputs, four Pt100 inputs and a REST API.

Start with the signals and the test sequence

Bring a description of your sensor or device, its interfaces and the measurements you want to repeat. We can then discuss acquisition, control and FPGA-processing requirements together.

Explore the ETRA product page and the broader engineering capabilities.